• 51
• SN74AHC08NSR
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-AND Gates
• 6页
• 90K

• 52
• SN74AHC08PWR
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-AND Gates
• 6页
• 90K

• 53
• SN74AHC08RGYR
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-AND Gates
• 6页
• 90K

• 54
• SN5446AJ
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 55
• SN5447AJ
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 56
• SN5448J
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 57
• SN74BCT544DW
• Texas Instruments Incorporated
• OCTAL REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS
• 6页
• 89K

• 58
• SN74BCT544NT
• Texas Instruments Incorporated
• OCTAL REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS
• 6页
• 89K

• 59
• SN74LS251D
• Texas Instruments Incorporated
• Data Selector/Multiplexer with 3-State Outputs
• 9页
• 312K

• 60
• SN74LS251N
• Texas Instruments Incorporated
• Data Selector/Multiplexer with 3-State Outputs
• 9页
• 312K

• 61
• SN74LS26D
• Texas Instruments Incorporated
• Quadruple 2-Input High-Voltage Interface Positive-NAND Gate
• 5页
• 90K

• 62
• SN74LS26N
• Texas Instruments Incorporated
• Quadruple 2-Input High-Voltage Interface Positive-NAND Gate
• 5页
• 90K

• 63
• SN74LS47D
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 64
• SN74LS47N
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 65
• SN74LS48D
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 66
• SN74LS48N
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 67
• SN74LS49D
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 68
• SN74LS49N
• Texas Instruments Incorporated
• BCD-to-Seven-Segment Decoder/Driver
• 14页
• 583K

• 69
• SN74LS590N
• Texas Instruments Incorporated
• 8 Bit Binary Counter with Output Registers
• 6页
• 236K

• 70
• SN74LS591N
• Texas Instruments Incorporated
• 8 Bit Binary Counter with Output Registers
• 6页
• 236K

• 71
• SN74LVT125D
• Texas Instruments Incorporated
• 3.3 V ABT Quadruple Bus Buffer with 3-State Outputs
• 10页
• 187K

• 72
• SN74LVT125DBR
• Texas Instruments Incorporated
• 3.3 V ABT Quadruple Bus Buffer with 3-State Outputs
• 10页
• 187K

• 73
• SN74LVT125DR
• Texas Instruments Incorporated
• 3.3 V ABT Quadruple Bus Buffer with 3-State Outputs
• 10页
• 187K

• 74
• SN74LVT125NSR
• Texas Instruments Incorporated
• 3.3 V ABT Quadruple Bus Buffer with 3-State Outputs
• 10页
• 187K

• 75
• SN74LVT125PWR
• Texas Instruments Incorporated
• 3.3 V ABT Quadruple Bus Buffer with 3-State Outputs
• 10页
• 187K

• 76
• SN74LVT182512DGG
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 35页
• 567K

• 77
• SN74LVT18512DGG
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 35页
• 567K

• 78
• SN74LVT8980ADW
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 34页
• 489K

• 79
• SN74LVT8980ADWR
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 34页
• 489K

• 80
• SN74LVT8980DW
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 36页
• 509K

• 81
• SN74LVT8986GGV
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 50页
• 859K

• 82
• SN74LVT8986PM
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 50页
• 859K

• 83
• SN74LVT8996DW
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 43页
• 647K

• 84
• SN74LVT8996PW
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 43页
• 647K

• 85
• SN74S251D
• Texas Instruments Incorporated
• Data Selector/Multiplexer with 3-State Outputs
• 9页
• 312K

• 86
• SN74S251N
• Texas Instruments Incorporated
• Data Selector/Multiplexer with 3-State Outputs
• 9页
• 312K

• 87
• SNJ54AHC08FK
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-AND Gates
• 6页
• 90K

• 88
• SNJ54AHC08J
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-AND Gates
• 6页
• 90K

• 89
• SNJ54AHC08W
• Texas Instruments Incorporated
• Quadruple 2-Input Positive-AND Gates
• 6页
• 90K

• 90
• SNJ54LVT8980AFK
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 34页
• 489K

• 91
• SNJ54LVT8980AJT
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 34页
• 489K

• 92
• SNJ54LVT8980AW
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 34页
• 489K

• 93
• SNJ54LVT8986HV
• Texas Instruments Incorporated
• SCAN Bridge, JTAG Test Port
• 50页
• 859K

• 94
• SN54BCT544FK
• Texas Instruments Incorporated
• OCTAL REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS
• 6页
• 89K

• 95
• SN54BCT544JT
• Texas Instruments Incorporated
• OCTAL REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS
• 6页
• 89K

• 96
• SN54BCT544W
• Texas Instruments Incorporated
• OCTAL REGISTERED TRANSCEIVER WITH 3-STATE OUTPUTS
• 6页
• 89K

• 97
• SP8542AN
• Sipex Corporation
• Two Channel 12-Bit Multiplexed Sampling ADCs
• 16页
• 444K

• 98
• SP8542AS
• Sipex Corporation
• Two Channel 12-Bit Multiplexed Sampling ADCs
• 16页
• 444K

• 99
• SP8542BN
• Sipex Corporation
• Two Channel 12-Bit Multiplexed Sampling ADCs
• 16页
• 444K

• 100
• SP8542BS
• Sipex Corporation
• Two Channel 12-Bit Multiplexed Sampling ADCs
• 16页
• 444K